• DocumentCode
    2360581
  • Title

    The isothermal discharge of a polystyrene electret via a distribution of electron trapping states

  • Author

    Watson, P. Keith ; Schmidlin, Fred W.

  • Author_Institution
    Xerox Corp., Webster, NY, USA
  • fYear
    1994
  • fDate
    7-9 Sep 1994
  • Firstpage
    13
  • Lastpage
    18
  • Abstract
    The distribution in energy of trapping states in a polymer may be studied by populating the traps and observing the current that accompanies the relaxation of the trapped charges. In this relaxation process the carriers from shallow traps are thermally excited, move a short distance, and become retrapped in deeper lying states, and so on through a multiple trapping scheme. The states may be populated by injection from an electron beam. The isothermal discharge that follows the initial charging event takes on a particularly simple form in the non-retrapping limit. The general case of arbitrary distribution of states with retrapping can be analyzed by using a multiple trapping formalism, and this analysis yields the required distribution of trapping states in the dielectric. We use this multiple trapping analysis solution to examine the shortcoming of the non-trapping, approximate solution to the isothermal discharge
  • Keywords
    deep levels; dielectric polarisation; dielectric relaxation; electrets; electric breakdown; electron traps; polymers; thermally stimulated currents; deeper lying states; electron trapping states distribution; isothermal discharge; multiple trapping scheme; polystyrene electret; shallow traps; thermally excited,; trap population; trapped charges relaxation; Amorphous materials; Dielectrics; Electrets; Electron beams; Electron traps; Energy measurement; Isothermal processes; Motion measurement; Polymer films; Surface charging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrets, 1994. (ISE 8), 8th International Symposium on
  • Conference_Location
    Paris
  • Print_ISBN
    0-7803-1940-0
  • Type

    conf

  • DOI
    10.1109/ISE.1994.514736
  • Filename
    514736