• DocumentCode
    2360681
  • Title

    Efficiency and robustness of some behavior laws in the description of viscoplastic deformation and degradation of solder materials

  • Author

    Msolli, Sabeur ; Zèanh, Adrien ; Dalverny, Olivier ; Karama, Moussa

  • Author_Institution
    INP/ENIT, Univ. de Toulouse, Tarbes, France
  • fYear
    2010
  • fDate
    26-28 April 2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Solder materials are critical packaging compounds and due to usually weakest melting temperature among packaging constitutive materials, thus, they are frequently subjected to a multitude of physical phenomena: creep, fatigue and combined hardening effects. The complexity and interaction of such factors must be considered in suitable way in the mechanical behaviour modelling using the appropriate material behaviour laws. The choice of the mechanical model depends on several factors such as the complexity of constitutive equations to be integrated, the availability and suitability of implementation in the FE codes, the number of parameters to be identified, the capability of the model to represent the most common physical features of the material... Following these observations and in order to deal with this critical remarks, comparisons between the most common unified viscoplastic models should be done in the local and finite element levels for the decision upon the most efficient model. That is the aim of this paper with application to a tin based solder token as the test material.
  • Keywords
    creep; fatigue; hardening; solders; viscoplasticity; creep; critical packaging compounds; fatigue; finite element levels; hardening effects; local element levels; material behaviour laws; mechanical behaviour modelling; physical phenomena; solder materials; viscoplastic deformation; Creep; Degradation; Equations; Fatigue; Finite element methods; Lead; Packaging; Robustness; Temperature; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal, Mechanical & Multi-Physics Simulation, and Experiments in Microelectronics and Microsystems (EuroSimE), 2010 11th International Conference on
  • Conference_Location
    Bordeaux
  • Print_ISBN
    978-1-4244-7026-6
  • Type

    conf

  • DOI
    10.1109/ESIME.2010.5464600
  • Filename
    5464600