Title :
Wireless LAN performance under varied stress conditions in vehicular traffic scenarios
Author :
Singh, Jatinder Pal ; Bambos, Nicholas ; Srinivasan, Bhaskar ; Clawin, Detlef
Author_Institution :
Dept. of Electr. Eng., Stanford Univ., CA, USA
Abstract :
Mobile ad-hoc networking with wireless LAN infrastructure can be employed to build inter-vehicle communication based applications. The associated high velocities and hostile driving environments pose a challenge to the performance of a wireless LAN. This paper assesses the performance of a wireless local area network in different vehicular traffic and mobility scenarios. The network throughput and the quality of the wireless communication channel, measured on IEEE 802.11b compliant equipment, are observed to degrade with increasingly stressful communication scenarios. The test scenarios are varied by conducting the experiments under different vehicular mobility, peer-distance and driving environment conditions. We present results that can facilitate development of efficient applications for inter-vehicular communication. We also suggest optimization measures through aggression control via variations in packet size.
Keywords :
ad hoc networks; land mobile radio; performance evaluation; road traffic; wireless LAN; IEEE 802.11b compliant equipment; aggression control; driving environment conditions; high velocities; hostile driving environments; inter-vehicle communication; inter-vehicular communication; mobile ad-hoc networking; network throughput; optimization measures; packet size; peer-distance conditions; stressful communication scenarios; vehicular mobility; vehicular traffic; wireless LAN infrastructure; wireless LAN performance; wireless communication channel quality; wireless local area network; Degradation; Mobile communication; Size control; Size measurement; Stress measurement; Telecommunication traffic; Testing; Throughput; Wireless LAN; Wireless communication;
Conference_Titel :
Vehicular Technology Conference, 2002. Proceedings. VTC 2002-Fall. 2002 IEEE 56th
Print_ISBN :
0-7803-7467-3
DOI :
10.1109/VETECF.2002.1040698