Title :
Characterization of radiometric transfer standards based on silicon trap detectors
Author :
Menegotto, Thiago ; Ferreira da Silva, T. ; Simoes, M. ; Sousa, Willian A. ; Borghi, Giacomo
Author_Institution :
Opt. Metrol. Div., Nat. Inst. of Metrol., Quality & Technol., Brazil
Abstract :
We present the characterization of the properties of the silicon trap detectors used in the construction of the traceability chain for radiometry at the Brazilian Institute of Metrology - Inmetro. These devices are used as standards for radiometry and photometry in the transfer of the optical power scale of the primary cryogenic radiometer standard. The experimental results for the spatial non-uniformity, polarization dependence and spectral responsivity are shown and discussed.
Keywords :
cryogenics; elemental semiconductors; optical sensors; photometry; power measurement; radiometry; silicon; transfer standards; Brazilian Institute of Metrology; Inmetro; Si; optical power scale; photometry; polarization dependence; primary cryogenic radiometer standard; radiometric transfer standard; silicon trap detector; spatial non-uniformity; spectral responsivity; Detectors; Laser beams; Measurement by laser beam; Optical polarization; Optical reflection; Radiometry; Standards; Optical metrology; Optical standards; Radiometry; Spectral responsivity;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on
Conference_Location :
Rio de Janeiro
Print_ISBN :
978-1-4799-5205-2
DOI :
10.1109/CPEM.2014.6898302
