• DocumentCode
    2361069
  • Title

    Investigating the impact of process variations on an asynchronous Time-Triggered-Protocol controller

  • Author

    Ferringer, Markus

  • Author_Institution
    Dept. of Comput. Eng., Vienna Univ. of Technol., Vienna, Austria
  • fYear
    2011
  • fDate
    27-30 June 2011
  • Firstpage
    47
  • Lastpage
    52
  • Abstract
    In recent years, asynchronous logic has often been used as feasible alternative to common synchronous logic design. However, changing the basic design paradigm from using a global clock signal (in order to hide all timing constraints and assumptions behind it) to the technique of local handshaking protocols is not always easy. The automatic adaption to changing operating conditions (“it runs as fast as possible”) also makes reliable timing predictions rather complex. While this might be an advantage for many applications, especially real-time systems need a precise, predictable and reliable notion of time, and continuously changing operating speeds are undesired. In this work we experimentally investigate the impact of process/fabrication variations on the execution speed and frequency stability of our asynchronous Time-Triggered-Protocol controller. We use a set of modern FPGA development boards and analyze the variations of important circuit-level properties such as execution speed, jitter characteristics and frequency stability. The measurement results are also compared to the expectations derived from the device timing data sheets and the respective post-layout simulations.
  • Keywords
    asynchronous circuits; circuit layout; field programmable gate arrays; logic design; FPGA development boards; asynchronous circuit design; asynchronous logic; asynchronous time-triggered-protocol controller; circuit-level properties; device timing data sheets; execution speed; frequency stability; jitter characteristics; local handshaking protocols; post-layout simulations; process-fabrication variations; synchronous logic design; Delay; Field programmable gate arrays; Histograms; Jitter; Temperature measurement; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Dependable Systems and Networks Workshops (DSN-W), 2011 IEEE/IFIP 41st International Conference on
  • Conference_Location
    Hong Kong
  • Print_ISBN
    978-1-4577-0374-4
  • Electronic_ISBN
    978-1-4577-0373-7
  • Type

    conf

  • DOI
    10.1109/DSNW.2011.5958834
  • Filename
    5958834