DocumentCode
236108
Title
Power-dependence measurement of the quality factor of superconducting microwave resonators at mK temperature
Author
Seon Hoo Kim ; Dong-Gwang Ha ; Gwan Yeol Park ; Jiman Choi ; Jung Hwan Park ; Woon Song ; Soon Gul Lee ; Hyunsik Im ; Hyungsang Kim ; Yonuk Chong
Author_Institution
Korea Res. Inst. of Stand. & Sci., Daejeon, South Korea
fYear
2014
fDate
24-29 Aug. 2014
Firstpage
174
Lastpage
175
Abstract
We report our setup and measurement results of the quality factor Q of superconducting microwave resonators at mK temperature in a dilution refrigerator. The power dependence of the superconducting resonators´ Q was measured down to the single photon level. Measurements were performed on two types of microwave resonators. First, a half-wavelength coplanar waveguide (CPW) resonator made of niobium film on an oxidized high-resistivity silicon substrate was measured. Then a rectangular box resonator made of machined superconducting aluminum alloy was measured. While the CPW chip resonator´s Q value showed noticeable decrease at low microwave power, the box resonator´s Q showed little power dependence. This setup is intended to perform characterization of various microwave resonators, which will serve as key components in superconducting qubit in circuit QED architecture.
Keywords
Q-factor measurement; coplanar waveguides; microwave measurement; microwave resonators; niobium; oxidation; power measurement; refrigerators; superconducting microwave devices; superconducting resonators; thin film circuits; CPW resonator; Nb; Si; circuit QED architecture; dilution refrigerator; half-wavelength coplanar waveguide resonator; machined superconducting aluminum alloy; niobium film; oxidized high-resistivity silicon substrate; power-dependence measurement; quality factor measurement; rectangular box resonator; single photon level; superconducting microwave resonator; superconducting qubit; Coplanar waveguides; Microwave amplifiers; Microwave measurement; Power measurement; Q-factor; Superconducting microwave devices; Temperature measurement; dilution refrigerator; microwave resonator; power dependence; quality factor; superconducting qubit; two-level state;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on
Conference_Location
Rio de Janeiro
ISSN
0589-1485
Print_ISBN
978-1-4799-5205-2
Type
conf
DOI
10.1109/CPEM.2014.6898315
Filename
6898315
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