DocumentCode :
2361202
Title :
Model-based fault injection for failure effect analysis — Evaluation of dependable SRAM for vehicle control units
Author :
Nakata, Yohei ; Ito, Yasuhiro ; Sugure, Yasuo ; Oho, Shigeru ; Takeuchi, Yusuke ; Okumura, Shunsuke ; Kawaguchi, Hiroshi ; Yoshimoto, Masahiko
Author_Institution :
Grad. Sch. of Syst. Inf., Kobe Univ., Kobe, Japan
fYear :
2011
fDate :
27-30 June 2011
Firstpage :
91
Lastpage :
96
Abstract :
We propose a fault-injection system (FIS) that can inject faults such as read/write margin failures and soft errors into a SRAM environment. The fault case generator (FCG) generates time-series SRAM failures in 7T/14T or 6T SRAM, and the proposed device model and fault-injection flow are applicable for system-level verification. For evaluation, an abnormal termination rate in vehicle engine control was adopted. We confirmed that the vehicle engine control system with the 7T/14T SRAM improves system-level dependability compared with the conventional 6T SRAM.
Keywords :
SRAM chips; automotive electronics; automotive engineering; failure (mechanical); time series; dependable SRAM; failure effect analysis; fault case generator; model-based fault injection; read-write margin failures; soft errors; termination rate; time series SRAM failures; vehicle engine control unit; Bit error rate; Engines; Large scale integration; Random access memory; Reliability; Transistors; Vehicles; SRAM; dependable processor; fault injection; system-level verification;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Dependable Systems and Networks Workshops (DSN-W), 2011 IEEE/IFIP 41st International Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4577-0374-4
Electronic_ISBN :
978-1-4577-0373-7
Type :
conf
DOI :
10.1109/DSNW.2011.5958842
Filename :
5958842
Link To Document :
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