TSD currents in some rare-earth-oxide-based thin-film sandwiches

Author

Wiktorczyk, Tadeusz

Author_Institution

Inst. of Phys., Wroclaw Univ., Poland

fYear

1994

fDate

7-9 Sep 1994

Firstpage

325

Lastpage

330

Abstract

Characteristics of thermally stimulated currents in metal/insulator/metal (MIM) thin-film sandwiches based on some rare earth oxides (sesquioxides of ytterbium, dysprosium and holmium) are presented. Electrical measurements were carried out for temperatures from 297 K to 500 K. The influence of the polarizing temperature, voltage and heating rate on the TSD characteristics was examined. The TSD thermograms for examined different rare earth oxides were very similar and are characterized by a single peak connected with 0.5-0.7 eV traps

Keywords

MIM structures; aluminium; dielectric depolarisation; dielectric polarisation; dielectric thin films; dysprosium compounds; electrets; electron traps; hole traps; holmium compounds; thermally stimulated currents; ytterbium compounds; 0.5 to 0.7 eV; 297 to 500 K; Al-Dy₂O₃-Al; Al-Ho₂O₃-Al; Al-Yb₂O₃-Al; Al/insulator/Al thin-film sandwich; Dy₂O₃; Ho₂O₃; Yb₂O₃; electrets; electrical measurements; heating rate; polarizing temperature; polarizing voltage; thermally stimulated currents; traps; Aluminum; Annealing; Conductivity; Electric variables measurement; Electrodes; Metal-insulator structures; Polarization; Temperature; Transistors; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrets, 1994. (ISE 8), 8th International Symposium on

Conference_Location

Paris

Print_ISBN

0-7803-1940-0

Type

conf

DOI

10.1109/ISE.1994.514789

Filename

514789