DocumentCode :
2361712
Title :
Design for manufacturability: a key to semiconductor manufacturing excellence
Author :
Wilcox, R. ; Forhan, T. ; Starkey, G. ; Turner, D.
Author_Institution :
Microelectron. Div., IBM Corp., Essex Junction, VT, USA
fYear :
1998
fDate :
23-25 Sep 1998
Firstpage :
308
Lastpage :
313
Abstract :
This paper reviews measures of manufacturing excellence and presents a design-for-manufacturability (DFM) program organized around early design and manufacturing teamwork and the economic analysis of design options. Typical measures of manufacturing excellence for a semiconductor fabricator are expressed in terms of either operational or economic results. Those expressed in terms of operational results are independent of the product mix in the fabricator while those expressed in terms of economic results integrate both fabricator and product design attributes into a single parameter such as revenue/wafer. Improvements in the operational measures of manufacturing excellence focus upon increases in capacity and throughput, defect density reductions, and cost containment. Improvements in the economic measures of manufacturing excellence must focus on both fabricator processing efficiency and the productivity of the design. Design-for-manufacturability practices can improve design productivity, time-to-market, and product performance and reliability by closely coupling semiconductor fabrication knowledge with product requirements during the initial phase of a product design. Every design decision produces both technical and economic consequences; understanding these consequences and using this knowledge in the design process to optimize product productivity and profitability is key to achieving manufacturing excellence for that product
Keywords :
circuit optimisation; design for manufacture; integrated circuit design; integrated circuit economics; integrated circuit manufacture; integrated circuit reliability; DFM; cost containment; defect density reductions; design decision; design for manufacturability; design options; design productivity; design-for-manufacturability practices; design-for-manufacturability program; early design/manufacturing teamwork; economic analysis; economic measures; economic results; fabricator processing efficiency; manufacturing excellence; manufacturing excellence measures; operational measures; operational results; process capacity; product design; product design attributes; product performance; product productivity optimization; product profitability optimization; product reliability; product requirements; revenue/wafer measure; semiconductor fabrication; semiconductor fabricator; semiconductor manufacturing excellence; throughput; time-to-market; Costs; Density measurement; Design for manufacture; Manufacturing processes; Product design; Productivity; Pulp manufacturing; Semiconductor device manufacture; Teamwork; Throughput;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Semiconductor Manufacturing Conference and Workshop, 1998. 1998 IEEE/SEMI
Conference_Location :
Boston, MA
ISSN :
1078-8743
Print_ISBN :
0-7803-4380-8
Type :
conf
DOI :
10.1109/ASMC.1998.731579
Filename :
731579
Link To Document :
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