Title :
Charge Pump Boosting Technique For Power Noise Immune High Speed PLL Implementation
Author :
Yoon, Kwangho ; Kim, Wonchan
Author_Institution :
School of Electrical Engineering, Seoul National University
Keywords :
Boosting; Charge pumps; Circuit noise; Filters; Noise reduction; Phase frequency detector; Phase locked loops; Threshold voltage; Voltage-controlled oscillators; Working environment noise;
Conference_Titel :
Optimization of Electrical and Electronic Equipments, 1998. OPTIM '98. Proceedings of the 6th International Conference on
Conference_Location :
Brasov, Romania
Print_ISBN :
973-98511-2-6
DOI :
10.1109/OPTIM.1998.708013