Title :
Surface Roughness Vision Measurement in Different Ambient Light Conditions
Author :
Zhang, Zhisheng ; Chen, Zixin ; Shi, Jinfei ; Jia, Fang ; Dai, Min
Author_Institution :
Sch. of Mech. Eng., Southeast Univ., Nanjing
Abstract :
Machine vision method was used to measure the surface roughness for different Phi38 mm grinding axes in different ambient light conditions. To analyze the effect of ambient light, a method based on the gray-level co-occurrence matrix was applied at the fist step. Then, a new calculation method was proposed to minimize the effect of ambient light during measurement. At the calibration stage, the intensity of ambient light was put into consideration to indicate the relationship between the surface roughness and the corresponding features of the workpiece image. To measure an unknown workpiece, the corresponding features of ambient light and inspected workpiece would be input to calculate the roughness value. Finally, a case study is provided to demonstrate the measurement procedures and effectiveness of the proposed methodology. The experiments show that the proposed method has better accuracy than the gray-level co-occurrence matrix method when the error between inspecting value and its corresponding real surface roughness is set at 0.05 mum.
Keywords :
calibration; computer vision; grinding; image colour analysis; matrix algebra; production engineering computing; surface roughness; ambient light conditions; calibration stage; gray-level cooccurrence matrix; grinding axes; machine vision method; surface roughness vision measurement; Calibration; Image analysis; Machine vision; Mechanical engineering; Mechanical variables measurement; Mechatronics; Rough surfaces; Surface finishing; Surface resistance; Surface roughness; ambient light; machine vision; measurement; surface;
Conference_Titel :
Mechatronics and Machine Vision in Practice, 2008. M2VIP 2008. 15th International Conference on
Conference_Location :
Auckland
Print_ISBN :
978-1-4244-3779-5
Electronic_ISBN :
978-0-473-13532-4
DOI :
10.1109/MMVIP.2008.4749497