DocumentCode :
2361995
Title :
Log-logistic software reliability growth model
Author :
Gokhale, Swapna S. ; Trivedi, Kishor S.
Author_Institution :
Bourns Coll. of Eng., California Univ., Riverside, CA, USA
fYear :
1998
fDate :
13-14 Nov 1998
Firstpage :
34
Lastpage :
41
Abstract :
The finite-failure non-homogeneous Poisson process (NHPP) models proposed in the literature exhibit either constant, monotonic increasing or monotonic decreasing failure occurrence rates per fault, and are inadequate to describe the failure processes underlying certain failure data sets. In this paper, we propose the log-logistic reliability growth model, which can capture the increasing/decreasing nature of the failure occurrence rate per fault. Equations are developed to estimate the parameters of the existing finite-failure NHPP models, as well as the log-logistic model, based on failure data collected in the form of inter-failure times. We also present an analysis of two data sets, where the underlying failure process could not be adequately described by the existing models, which motivated the development of the log-logistic model
Keywords :
Poisson distribution; equations; parameter estimation; software reliability; NHPP models; constant failure occurrence rate; data analysis; equations; failure data sets; finite-failure nonhomogeneous Poisson process models; inter-failure times; log-logistic software reliability growth model; monotonic decreasing failure occurrence rate; monotonic increasing failure occurrence rate; parameter estimation; underlying failure process; Educational institutions; Equations; Hazards; Logistics; Parameter estimation; Predictive models; Software reliability; Software systems; Software testing; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High-Assurance Systems Engineering Symposium, 1998. Proceedings. Third IEEE International
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-9221-9
Type :
conf
DOI :
10.1109/HASE.1998.731593
Filename :
731593
Link To Document :
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