DocumentCode
236211
Title
Development of high accuracy standard capacitance box
Author
Dongxue Dai ; Xiaobing He ; Pan Jin ; Wei Wang
Author_Institution
Nat. Inst. of Metrol., Beijing, China
fYear
2014
fDate
24-29 Aug. 2014
Firstpage
280
Lastpage
281
Abstract
This paper describes the dielectric material and the structure of the standard capacitance box (decade capacitor) developed by NIM with the capacitance range of 1pF to 0.1μF and the accuracy of 50ppm at 1 kHz. High stability and high accuracy of the standard capacitance box mainly derives from a choice of dielectric materials that are fused-silica and nano-ceramic, and each capacitor in the box contained a constant temperature control system. Special decade switch with the three-terminal full shield structure can eliminate the capacitance variance caused by the stray capacitance so that higher accuracy and lower zero capacitance can be achieved.
Keywords
capacitance measurement; capacitors; ceramics; circuit stability; dielectric materials; measurement standards; nanostructured materials; temperature control; NIM; capacitance 1 pF to 0.1 muF; constant temperature control system; decade capacitor; dielectric material; frequency 1 kHz; fused-silica material; nanoceramic material; stability; standard capacitance box structure; stray capacitance; three-terminal full shield structure; Accuracy; Capacitance; Capacitors; Dielectric materials; Standards; Switches; Temperature control; Measurement; constant temperature; control system; fused-silica; nano-ceramic; special decade switch; standard capacitance box;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on
Conference_Location
Rio de Janeiro
ISSN
0589-1485
Print_ISBN
978-1-4799-5205-2
Type
conf
DOI
10.1109/CPEM.2014.6898368
Filename
6898368
Link To Document