DocumentCode :
236213
Title :
Development of high accuracy standard capacitors
Author :
Xiaobing He ; Dongxue Dai ; Pan Jin ; Wei Wang
Author_Institution :
Nat. Inst. of Metrol., Beijing, China
fYear :
2014
fDate :
24-29 Aug. 2014
Firstpage :
282
Lastpage :
283
Abstract :
This paper describes the dielectric material and the structure of standard capacitors developed by NIM, with capacitance range of 1pF to 1μF and the accuracy of 5ppm to 50ppm at 1 kHz. High stability and high accuracy of standard capacitors mainly derives from a choice of dielectric materials which are fused-silica and nano-ceramic. And the capacitors are placed into a constant temperature control system to eliminate the capacitance variance caused by the environment temperature change.
Keywords :
capacitance measurement; capacitors; ceramics; dielectric materials; measurement standards; nanostructured materials; silicon compounds; temperature control; NIM; SiO2; capacitance 1 pF to 1 muF; constant temperature control system; dielectric material; environment temperature change; frequency 1 kHz; fused silica; nanoceramic; standard capacitors; Accuracy; Capacitance; Capacitors; Materials; Standards; Temperature control; Temperature measurement; Measurement; constant temperature control system; fused-silica material; nano-ceramic material; nano-material adding; standard capacitor;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on
Conference_Location :
Rio de Janeiro
ISSN :
0589-1485
Print_ISBN :
978-1-4799-5205-2
Type :
conf
DOI :
10.1109/CPEM.2014.6898369
Filename :
6898369
Link To Document :
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