Development of high accuracy standard capacitors

Author

Xiaobing He ; Dongxue Dai ; Pan Jin ; Wei Wang

Author_Institution

Nat. Inst. of Metrol., Beijing, China

fYear

2014

fDate

24-29 Aug. 2014

Firstpage

282

Lastpage

283

Abstract

This paper describes the dielectric material and the structure of standard capacitors developed by NIM, with capacitance range of 1pF to 1μF and the accuracy of 5ppm to 50ppm at 1 kHz. High stability and high accuracy of standard capacitors mainly derives from a choice of dielectric materials which are fused-silica and nano-ceramic. And the capacitors are placed into a constant temperature control system to eliminate the capacitance variance caused by the environment temperature change.

Keywords

capacitance measurement; capacitors; ceramics; dielectric materials; measurement standards; nanostructured materials; silicon compounds; temperature control; NIM; SiO₂; capacitance 1 pF to 1 muF; constant temperature control system; dielectric material; environment temperature change; frequency 1 kHz; fused silica; nanoceramic; standard capacitors; Accuracy; Capacitance; Capacitors; Materials; Standards; Temperature control; Temperature measurement; Measurement; constant temperature control system; fused-silica material; nano-ceramic material; nano-material adding; standard capacitor;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on

Conference_Location

Rio de Janeiro

ISSN

0589-1485

Print_ISBN

978-1-4799-5205-2

Type

conf

DOI

10.1109/CPEM.2014.6898369

Filename

6898369