• DocumentCode
    236222
  • Title

    A 100 TΩ guarded Hamon transfer standard

  • Author

    O´Brien, Edward ; Jarrett, Dean G. ; Kraft, Marlin E.

  • Author_Institution
    SUNY - Binghamton Univ., Binghamton, NY, USA
  • fYear
    2014
  • fDate
    24-29 Aug. 2014
  • Firstpage
    294
  • Lastpage
    295
  • Abstract
    Guarded Hamon transfer standards are used at the National Institute of Standards and Technology (NIST) for scaling to high resistance levels. An improved design for a guarded Hamon transfer standard in the range from 1 TΩ to 100 TΩ is described. Measurements taken to select the primary and guard resistor elements are described, as well as the process used to clean the resistor elements. The selection process for resistor elements focused on choosing the smallest settling times and narrowest range of corrections from nominal value. Key aspects of this guarded Hamon transfer standard are the elimination of charge-storing materials in its connections, selection of resistors to minimize leakage currents, and the hermetic sealing of all the elements inside one enclosure.
  • Keywords
    electric resistance measurement; hermetic seals; leakage currents; resistors; transfer standards; National Institute of Standards and Technology; guard resistor element; guarded Hamon transfer standard; hermetic sealing; leakage current minimization; resistance 1 Tohm to 100 Tohm; resistance level scaling; Electrical resistance measurement; NIST; Pollution measurement; Resistance; Resistors; Seals; Measurement; guarded Hamon transfer standard; scaling; settling time; standard resistor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on
  • Conference_Location
    Rio de Janeiro
  • ISSN
    0589-1485
  • Print_ISBN
    978-1-4799-5205-2
  • Type

    conf

  • DOI
    10.1109/CPEM.2014.6898375
  • Filename
    6898375