Evaluation of the V(x) temperature stability in time-resolved ultrasonic measurements

Author

Titov, S.A. ; Maev, R.G. ; Bogatchenkov, A.N.

Author_Institution

Centre for Imaging Res. & Adv. Material Characterization, Windsor Univ., Ont., Canada

Volume

1

fYear

2001

fDate

2001

Firstpage

497

Abstract

Thermal errors of time-resolved ultrasonic material characterization systems are considered. For V(z) data acquisition configuration, theoretically estimated the thermal error coefficient of leaky wave velocity was found to be 10^-3 1/°C. It was shown that the reading of the sound velocity in immersion liquid is not required for V(x) data processing. The thermal error coefficient estimated experimentally in 20-50°C range with the developed V(x) system is 5·10^-5 1/°C for a water-fused quartz interface

Keywords

acoustic wave velocity; quartz; surface acoustic waves; thermal stability; water; 20 to 50 degC; SiO₂-H₂O; V(x) temperature stability; leaky wave velocity; sound velocity; thermal error coefficient; time-resolved ultrasonic material characterization; time-resolved ultrasonic measurements; water-fused quartz interface; Biological materials; Data acquisition; Equations; Frequency; Measurement errors; Stability; Temperature; Transducers; Ultrasonic variables measurement; Velocity measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Ultrasonics Symposium, 2001 IEEE

Conference_Location

Atlanta, GA

Print_ISBN

0-7803-7177-1

Type

conf

DOI

10.1109/ULTSYM.2001.991671

Filename

991671