Title :
The EMRP project Metrology for III–V materials based high efficiency multi-junction solar cells
Author :
Bounouh, A. ; Almuneau, G. ; Baumgartner, H. ; Cuenat, A. ; Gambacorti, N. ; Hoffmann, J. ; Kern, R. ; Kienberger, F. ; Krupka, Jerzy ; Lackner, David ; Pollakowski, B. ; Rodriguez, T.G. ; Sametoglu, F. ; Usydus, L. ; Winter, Stefan ; Witt, F.
Author_Institution :
Lab. Nat. de Metrol. et d´Essais, Paris, France
Abstract :
End of 2013 EURAMET, the European metrology organization opened a call to advance measurement science and technology in the field of Energy by providing funding for Joint Research Projects (JRP) to be funded jointly by the European Commission and the participating countries in the frame of the European Metrology Research Programme (EMRP). This paper describes a planned project; no technical results will be available at the time of the conference. We feel, however, that CPEM is a suitable platform to discuss our plans.
Keywords :
III-V semiconductors; solar cells; EMRP project metrology; III-V materials; high efficiency multijunction solar cells; Europe; Materials; Metrology; Photovoltaic cells; Semiconductor device measurement; Solar energy; Standards; III–V materials characterization; Multijunction solar cells standards; Nanoscale electrical measurement; high conversion efficiency;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on
Conference_Location :
Rio de Janeiro
Print_ISBN :
978-1-4799-5205-2
DOI :
10.1109/CPEM.2014.6898387
