DocumentCode
2362516
Title
Iterative row-column soft-decision feedback algorithm using joint extrinsic information for two-dimensional intersymbol interference
Author
Chen, Yiming ; Belzer, Benjamin J. ; Sivakumar, Krishnamoorthy
Author_Institution
Sch. of Electr. Eng. & Comput. Sci., Washington State Univ., Pullman, WA, USA
fYear
2010
fDate
17-19 March 2010
Firstpage
1
Lastpage
6
Abstract
In this paper, we redesign the previous iterative row-column soft decision feedback algorithm (Cheng et al., 2007) for a two-dimensional intersymbol interference channel with additive white Gaussian noise; a 2 Ã 2 averaging mask and two 3 Ã 3 masks are considered. In particular, we consider the joint statistics for a block of pixels involved in the exchange of extrinsic information between the detectors; previously, these pixels were considered to be statistically independent. The new algorithm, referred to as the block (BLK) algorithm, provides more than 1 dB SNR gain; the resulting performance is within 0.3 dB from the maximum likelihood bound for the masks considered. To address the increased computational and storage complexity introduced by the joint statistics, we have developed a simplified version of the block (SBLK) algorithm. Experimental results demonstrate that the SBLK algorithm performs almost as well as the BLK algorithm.
Keywords
AWGN; computational complexity; intersymbol interference; maximum likelihood estimation; additive white Gaussian noise; block algorithm; gain 1 dB; iterative row-column soft-decision feedback algorithm; joint extrinsic information; maximum likelihood bound; storage complexity; two-dimensional intersymbol interference; Computer science; Detectors; Gain; Holographic optical components; Intersymbol interference; Iterative algorithms; Maximum likelihood detection; Optical feedback; State feedback; Statistics; Joint statistics; Row-column algorithm; Soft decision feedback; Two-dimensional intersymbol interference;
fLanguage
English
Publisher
ieee
Conference_Titel
Information Sciences and Systems (CISS), 2010 44th Annual Conference on
Conference_Location
Princeton, NJ
Print_ISBN
978-1-4244-7416-5
Electronic_ISBN
978-1-4244-7417-2
Type
conf
DOI
10.1109/CISS.2010.5464706
Filename
5464706
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