• DocumentCode
    2362792
  • Title

    Opportunistic multimodel-based diagnosis: Framing all the knowledge we have to diagnose complex artifacts

  • Author

    Bonarini, Andrea ; Sassaroli, Piera

  • Author_Institution
    Dipartimento di Elettronica, Politecnico di Milano, Italy
  • fYear
    1993
  • fDate
    1-5 Mar 1993
  • Firstpage
    429
  • Lastpage
    436
  • Abstract
    Presents OMISSYS (Opportunistic Multimodel-based diagnosIS SYStem), an approach to diagnosis where all the available knowledge is framed into different types of models, belonging to a space defined by: level of abstraction, uncertainty, and epistemological type. All the knowledge is represented using possibly qualitative relationships among variables and possibly approximated values. OMISSYS uses the so-framed incomplete, uncertain, and approximate knowledge to diagnose a complex artifact, such as an industrial plant. It navigates opportunistically through an arbitrary set of models to reach a predefined diagnosis goal
  • Keywords
    diagnostic expert systems; diagnostic reasoning; frame based representation; model-based reasoning; uncertainty handling; OMISSYS; abstraction level; approximated values; complex artifacts diagnosis; diagnosis goal; epistemological type; incomplete knowledge; industrial plant; knowledge framing; knowledge representation; models; opportunistic multimodel-based diagnosis; qualitative relationships; uncertainty; Computational complexity; Diagnostic expert systems; Fault diagnosis; Industrial plants; Industrial relations; Knowledge acquisition; Navigation; Observability; System testing; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Artificial Intelligence for Applications, 1993. Proceedings., Ninth Conference on
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    0-8186-3840-0
  • Type

    conf

  • DOI
    10.1109/CAIA.1993.366635
  • Filename
    366635