DocumentCode
2362792
Title
Opportunistic multimodel-based diagnosis: Framing all the knowledge we have to diagnose complex artifacts
Author
Bonarini, Andrea ; Sassaroli, Piera
Author_Institution
Dipartimento di Elettronica, Politecnico di Milano, Italy
fYear
1993
fDate
1-5 Mar 1993
Firstpage
429
Lastpage
436
Abstract
Presents OMISSYS (Opportunistic Multimodel-based diagnosIS SYStem), an approach to diagnosis where all the available knowledge is framed into different types of models, belonging to a space defined by: level of abstraction, uncertainty, and epistemological type. All the knowledge is represented using possibly qualitative relationships among variables and possibly approximated values. OMISSYS uses the so-framed incomplete, uncertain, and approximate knowledge to diagnose a complex artifact, such as an industrial plant. It navigates opportunistically through an arbitrary set of models to reach a predefined diagnosis goal
Keywords
diagnostic expert systems; diagnostic reasoning; frame based representation; model-based reasoning; uncertainty handling; OMISSYS; abstraction level; approximated values; complex artifacts diagnosis; diagnosis goal; epistemological type; incomplete knowledge; industrial plant; knowledge framing; knowledge representation; models; opportunistic multimodel-based diagnosis; qualitative relationships; uncertainty; Computational complexity; Diagnostic expert systems; Fault diagnosis; Industrial plants; Industrial relations; Knowledge acquisition; Navigation; Observability; System testing; Uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
Artificial Intelligence for Applications, 1993. Proceedings., Ninth Conference on
Conference_Location
Orlando, FL
Print_ISBN
0-8186-3840-0
Type
conf
DOI
10.1109/CAIA.1993.366635
Filename
366635
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