DocumentCode :
2362853
Title :
Development and implementation of an automated wafer transport system
Author :
Sikich, Joe
Author_Institution :
Hewlett Packard, Corvallis, OR, USA
fYear :
1998
fDate :
23-25 Sep 1998
Firstpage :
400
Lastpage :
404
Abstract :
The move to 300 mm wafers has prompted IC manufacturers to demand a reliable automated material handling system (AMHS). Hewlett Packard´s Inkjet Supplies Business Unit has worked with a supplier to develop a system using overhead rails and vehicles with hoist mechanisms to perform direct-to-tool delivery of 200 mm podded wafers. The system is intended to increase throughput by providing just-in-time material delivery and improve safety by minimizing manual handling. The system has a near zero footprint, leaving valuable floor space for process tools. While the system was built specifically for 200 mm material, most of this effort is directly applicable to 300 mm systems, and tests on the new system are very promising. Tool-to-tool delivery time was approximately 38 s, and pod placement accuracy was satisfactory regardless of pod load or vertical hoisting distance. Long term reliability tests indicated mean cycles between interrupts (MCBI) per vehicle of approximately 3,286 cycles (where a cycle is a pod move from between tools). All but one of the incidents encountered during reliability testing were recovered in 1 minute or less. A third party failure mode analysis identified a small number of potential safety hazards, which the supplier is addressing. Our study also identified issues to be addressed prior to production implementation, including improved vehicle maintenance procedures and better methods of identifying, troubleshooting and resolving system errors. Further modeling and scenario testing may need to be performed to better estimate system benefits and potential integration issues for specific applications
Keywords :
computer integrated manufacturing; failure analysis; flexible manufacturing systems; hoists; integrated circuit manufacture; integrated circuit packaging; integrated circuit reliability; maintenance engineering; materials handling; safety; semiconductor process modelling; 1 min; 200 mm; 300 mm; 38 s; IC manufacture; automated material handling system; automated wafer transport system; automated wafer transport system development; automated wafer transport system implementation; direct-to-tool delivery; floor space; integration issues; just-in-time material delivery; long term reliability tests; manual handling minimization; mean cycles between interrupts; modeling; overhead rails; pod load; pod placement accuracy; podded wafers; process tools; production implementation; reliability testing; safety; safety hazards; scenario testing; system error identification; system error troubleshooting; system errors; system footprint; third party failure mode analysis; throughput; tool-to-tool delivery time; vehicle hoist mechanisms; vehicle maintenance procedures; vertical hoisting distance; wafer size; Failure analysis; Manufacturing automation; Materials handling; Materials reliability; Materials testing; Rails; Safety; System testing; Throughput; Vehicles;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Semiconductor Manufacturing Conference and Workshop, 1998. 1998 IEEE/SEMI
Conference_Location :
Boston, MA
ISSN :
1078-8743
Print_ISBN :
0-7803-4380-8
Type :
conf
DOI :
10.1109/ASMC.1998.731633
Filename :
731633
Link To Document :
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