DocumentCode :
2362973
Title :
Maximum likelihood and minimum mean squared error estimations for measurement of light intensity
Author :
Komaee, Arash
Author_Institution :
Dept. of Aerosp. Eng., Univ. of Maryland, College Park, MD, USA
fYear :
2010
fDate :
17-19 March 2010
Firstpage :
1
Lastpage :
6
Abstract :
The electrical signal at the output of an optical detector is mathematically modeled by a stochastic process consisted of a marked and filtered Poisson process and an additive white Gaussian noise. The measurement of a constant light intensity using an optical detector is formulated in terms of estimating the rate of the Poisson process involved in this model. Two cases are considered: minimum mean squared error estimation when the prior density of the rate is known, and maximum likelihood estimation when a priori information about the rate does not exist. The solutions to these estimation problems are determined in terms of an expression which can be computed only by means of a nonlinear infinite-dimensional system. Under a high intensity or low signal to noise ratio regime, this expression is approximated by a simpler expression which can be implemented using a linear filter. Based on this approximation, an explicit form for the maximum likelihood estimator is developed.
Keywords :
intensity measurement; least mean squares methods; maximum likelihood estimation; optical communication; optical signal detection; stochastic processes; additive white Gaussian noise; light intensity measurement; linear filter; maximum likelihood error estimations; minimum mean squared error estimations; nonlinear infinite-dimensional system; optical detector; poisson process; stochastic process; Additive white noise; Error analysis; Mathematical model; Maximum likelihood detection; Maximum likelihood estimation; Nonlinear filters; Optical detectors; Optical filters; Signal processing; Stochastic processes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Sciences and Systems (CISS), 2010 44th Annual Conference on
Conference_Location :
Princeton, NJ
Print_ISBN :
978-1-4244-7416-5
Electronic_ISBN :
978-1-4244-7417-2
Type :
conf
DOI :
10.1109/CISS.2010.5464733
Filename :
5464733
Link To Document :
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