• DocumentCode
    2362973
  • Title

    Maximum likelihood and minimum mean squared error estimations for measurement of light intensity

  • Author

    Komaee, Arash

  • Author_Institution
    Dept. of Aerosp. Eng., Univ. of Maryland, College Park, MD, USA
  • fYear
    2010
  • fDate
    17-19 March 2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The electrical signal at the output of an optical detector is mathematically modeled by a stochastic process consisted of a marked and filtered Poisson process and an additive white Gaussian noise. The measurement of a constant light intensity using an optical detector is formulated in terms of estimating the rate of the Poisson process involved in this model. Two cases are considered: minimum mean squared error estimation when the prior density of the rate is known, and maximum likelihood estimation when a priori information about the rate does not exist. The solutions to these estimation problems are determined in terms of an expression which can be computed only by means of a nonlinear infinite-dimensional system. Under a high intensity or low signal to noise ratio regime, this expression is approximated by a simpler expression which can be implemented using a linear filter. Based on this approximation, an explicit form for the maximum likelihood estimator is developed.
  • Keywords
    intensity measurement; least mean squares methods; maximum likelihood estimation; optical communication; optical signal detection; stochastic processes; additive white Gaussian noise; light intensity measurement; linear filter; maximum likelihood error estimations; minimum mean squared error estimations; nonlinear infinite-dimensional system; optical detector; poisson process; stochastic process; Additive white noise; Error analysis; Mathematical model; Maximum likelihood detection; Maximum likelihood estimation; Nonlinear filters; Optical detectors; Optical filters; Signal processing; Stochastic processes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Sciences and Systems (CISS), 2010 44th Annual Conference on
  • Conference_Location
    Princeton, NJ
  • Print_ISBN
    978-1-4244-7416-5
  • Electronic_ISBN
    978-1-4244-7417-2
  • Type

    conf

  • DOI
    10.1109/CISS.2010.5464733
  • Filename
    5464733