• DocumentCode
    236302
  • Title

    Milligram mass metrology using electrostatics

  • Author

    Shaw, Gordon A. ; Kramar, John A.

  • Author_Institution
    Mass & Force Group, U.S. Nat. Inst. of Stand. & Technol., MA, USA
  • fYear
    2014
  • fDate
    24-29 Aug. 2014
  • Firstpage
    374
  • Lastpage
    375
  • Abstract
    Although mass has historically been defined using an artifact standard, other means of realization are possible. One alternative approach employs a precision electromechanical balance to derive a force based on electrical units, which is used to measure the weight of a mass artifact. The National Institute of Standards and Technology (NIST) Electrostatic Force Balance (EFB) incorporates voltage, displacement and capacitance measurements that are traceable to the International System of Units (SI), allowing the traceable measurement of electrostatic force that can be used in conjunction with local gravity to arrive at mass. This article briefly describes this weighing process, its associated uncertainty, and context within the impending redefinition of the SI.
  • Keywords
    balances; capacitance measurement; displacement measurement; electrostatics; force measurement; measurement standards; measurement uncertainty; voltage measurement; weighing; EFB; International System of Units; NIST; National Institute of Standards and Technology; SI; capacitance measurement; displacement measurement; electrical unit; electrostatic force balance; electrostatic force measurement; local gravity conjunction; mass measurement; measurement uncertainty; milligram mass metrology; precision electromechanical balance; voltage measurement; weighing process; weight measurement; Capacitance; Capacitors; Electrostatics; Force; NIST; Uncertainty; Measurement; electrostatics; force; kilogram; mass; measurement standards;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on
  • Conference_Location
    Rio de Janeiro
  • ISSN
    0589-1485
  • Print_ISBN
    978-1-4799-5205-2
  • Type

    conf

  • DOI
    10.1109/CPEM.2014.6898415
  • Filename
    6898415