Dynamic dispatch and graphical monitoring system

Author

Pierce, Neal G. ; Yurtsever, Tanju

Author_Institution

Adv. Products Res. & Dev. Lab., Motorola Inc., Austin, TX, USA

fYear

1998

fDate

23-25 Sep 1998

Firstpage

464

Lastpage

468

Abstract

This paper presents the development and implementation of Motorola´s graphical manufacturing monitoring system (GraMMS) that provides real-time graphical monitoring of manufacturing data including work-in-process (WIP), equipment, throughput, and dispatch rankings. GraMMS consists of four main applications namely; dynamic dispatch, WIP monitoring system (WMS), equipment management system (EMS), and throughput monitoring system (TMS). GraMMS (Pierce and Yurtsever, 1997) provides Motorola semiconductor wafer fabs with instant data-driven decision support and trend analysis as well as a short-interval scheduler via discrete-event simulation. The dynamic dispatch system is a combination of simulation and heuristics based on concepts from the theory of constraints. This competitive advantage increases output, decreases cycle time, and improves resource utilization

Keywords

constraint theory; decision support systems; discrete event simulation; graphical user interfaces; integrated circuit manufacture; manufacturing resources planning; materials handling; process control; process monitoring; production control; scheduling; GraMMS; Motorola graphical manufacturing monitoring system; Motorola semiconductor wafer fabs; WIP monitoring system; cycle time; data-driven decision support; discrete-event simulation; dispatch rankings; dynamic dispatch; dynamic dispatch system; equipment management system; graphical monitoring system; heuristics; manufacturing data; process equipment; process output; process throughput; real-time graphical monitoring; resource utilization; short-interval scheduler; simulation; theory of constraints; throughput monitoring system; trend analysis; work-in-process; Constraint theory; Discrete event simulation; Job shop scheduling; Medical services; Monitoring; Pulp manufacturing; Real time systems; Resource management; Semiconductor device manufacture; Throughput;

fLanguage

English

Publisher

ieee

Conference_Titel

Advanced Semiconductor Manufacturing Conference and Workshop, 1998. 1998 IEEE/SEMI

Conference_Location

Boston, MA

ISSN

1078-8743

Print_ISBN

0-7803-4380-8

Type

conf

DOI

10.1109/ASMC.1998.731647

Filename

731647