Title :
SELDI-TOF-MS pattern analysis for cancer detection as a base for diagnostic software
Author :
Radlak, M. ; Klempous, Ryszard
Author_Institution :
Wroclaw Univ. of Technol., Wroclaw
Abstract :
Cancer is one of the twenty-first century disease affecting thousands of people around the globe every year. The biggest problem is that there is currently no non-invasive method for detection, while early detected can be cured avoiding death of a person. SELDI-TOF-MS can be used but resulting data are very noisy. Therefore methods for data preprocessing and classification are reviewed and their effectiveness measured. Finally requirements of diagnosis software are discussed.
Keywords :
cancer; medical diagnostic computing; patient diagnosis; pattern classification; cancer detection; data classification; data preprocessing; diagnostic software; pattern analysis; Cancer detection; Chemical lasers; Chemical technology; Diseases; Ionization; Laser transitions; Mass spectroscopy; Pattern analysis; Proteins; Surface emitting lasers;
Conference_Titel :
AFRICON 2007
Conference_Location :
Windhoek
Print_ISBN :
978-1-4244-0987-7
Electronic_ISBN :
978-1-4244-0987-7
DOI :
10.1109/AFRCON.2007.4401485
