DocumentCode :
236342
Title :
Direct comparison between CMS Programmable and conventional Josephson Voltage Standards
Author :
Shih-Fang Chen ; Hsu, J.C.
Author_Institution :
Center for Meas. Stand., Ind. Technol. Res. Inst., Hsinchu, Taiwan
fYear :
2014
fDate :
24-29 Aug. 2014
Firstpage :
414
Lastpage :
415
Abstract :
The 10 V Programmable Josephson Voltage Standard (PJVS) system was successfully set up at Center for Measurement Standards (CMS). In order to more precisely evaluate the performance of this system, we directly compared the PJVS system with our conventional JVS (CJVS) system. The comparison result shows excellent agreement between these two systems. The agreement between these two systems at 1.018 V was 0.72 nV with a combined standard uncertainty of 1.02 nV, and 1.1 nV at 10 V with a combined standard uncertainty of 1.67 nV or a relative standard uncertainty of 1.67×10-10.
Keywords :
Josephson effect; measurement standards; measurement uncertainty; voltage measurement; CJVS system; CMS; CMS programmable Josephson voltage standard system; Center for Measurement Standards; PJVS system; conventional Josephson voltage standard system; measurement uncertainty; voltage 0.72 nV; voltage 1.018 V; voltage 1.02 V; voltage 1.1 nV; voltage 10 V; Measurement uncertainty; Microwave amplifiers; Microwave measurement; Microwave oscillators; Standards; Uncertainty; Voltage measurement; Conventional Josephson voltage standard (CJVS); Zener voltage standard; measurement uncertainty; programmable JVS (PJVS); quantum-voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on
Conference_Location :
Rio de Janeiro
ISSN :
0589-1485
Print_ISBN :
978-1-4799-5205-2
Type :
conf
DOI :
10.1109/CPEM.2014.6898435
Filename :
6898435
Link To Document :
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