• DocumentCode
    236369
  • Title

    Characterization of hybrid metal/semiconductor electron pumps for quantum metrology

  • Author

    Charron, T. ; Devoille, L. ; Djordjevic, S. ; Seron, O. ; Piquemal, F. ; Clapera, P. ; Ray, S.J. ; Jehl, Xavier ; Wacquez, R. ; Vinet, M.

  • Author_Institution
    LNE, Trappes, France
  • fYear
    2014
  • fDate
    24-29 Aug. 2014
  • Firstpage
    442
  • Lastpage
    443
  • Abstract
    We present measurements of the quantized current delivered by a hybrid metal/semiconductor electron pump. Here we report on the dependence of the quantized current as a function of various control parameters at temperatures below 1 K. This characterization was done with a 20000 turns cryogenic current comparator (CCC) in internal feedback mode. Stability measurements over more than 10 hours have demonstrated a relative type A standard uncertainty of 4 parts in 106. To benefit from the high accuracy of the CCC, we are currently improving the traceability of the current measurement.
  • Keywords
    circuit feedback; cryogenic electronics; current comparators; electric current measurement; measurement standards; measurement uncertainty; semiconductor devices; CCC; cryogenic current comparator; hybrid metal-semiconductor electron pump; internal feedback mode; quantum current measurement; quantum current metrology; stability measurement; standard uncertainty; Cryogenics; Current measurement; Logic gates; Metals; Metrology; Semiconductor device measurement; Silicon; Cryogenic current comparator; Electron pumps; Quantum metrology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on
  • Conference_Location
    Rio de Janeiro
  • ISSN
    0589-1485
  • Print_ISBN
    978-1-4799-5205-2
  • Type

    conf

  • DOI
    10.1109/CPEM.2014.6898449
  • Filename
    6898449