• DocumentCode
    236374
  • Title

    Modeling of an adiabatic tunable-barrier electron pump

  • Author

    Ray, S.J. ; Clapera, P. ; Jehl, Xavier ; Charron, T. ; Djordjevic, S. ; Devoille, L. ; Potanina, E. ; Barinovs, G. ; Kashcheyevs, Vyacheslavs

  • Author_Institution
    SPSMS INAC, UJF-Grenoble 1, Grenoble, France
  • fYear
    2014
  • fDate
    24-29 Aug. 2014
  • Firstpage
    446
  • Lastpage
    447
  • Abstract
    We present a model for the operation of a single-island adiabatic electron pump with field-effect transistors acting as tunable barriers. We account for the electrostatics by modeling the capacitive network and fit the parameters of the gate-dependent barrier conductances which include exponential dependence in the subthreshold regime. This procedure results in the knowledge of the parametric dependence of the tunneling rates in the master equation for sequential tunneling. We compute the pumping current by numerically integrating the time-dependent master equation along a closed contour traversed in the gate voltage plane by the two out-of-phase harmonic signals that drive the pump. Basic features expected for a quantized adiabatic pump are reproduced by the calculation which will be extended to explore and differentiate the error mechanisms of the pump.
  • Keywords
    capacitors; charge pump circuits; electric admittance; electrostatics; error analysis; field effect transistors; harmonic analysis; integration; quantisation (signal); tunnelling; adiabatic tunable barrier electron pump; capacitive network modeling; closed contour; electrostatics; error mechanism; field effect transistor; gate dependent barrier conductance; gate voltage plane; numerical integration; out-of-phase harmonic signal; parameter fitting; pumping current computation; quantized adiabatic pump; sequential tunneling; subthreshold regime; time dependent master equation; tunneling rate; Electrostatics; Equations; Logic gates; Mathematical model; Quantization (signal); Radio frequency; Tunneling; Charge Pumping; Coulomb Blockade; Electron Pump; Si-CMOS; Simulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on
  • Conference_Location
    Rio de Janeiro
  • ISSN
    0589-1485
  • Print_ISBN
    978-1-4799-5205-2
  • Type

    conf

  • DOI
    10.1109/CPEM.2014.6898451
  • Filename
    6898451