• DocumentCode
    236376
  • Title

    Precise dielectric characterization of liquid crystal polymer films at microwave frequencies by new transverse slotted cavity

  • Author

    Liu Chao ; Afsar, Mohammed N.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Tufts Univ., Medford, MA, USA
  • fYear
    2014
  • fDate
    24-29 Aug. 2014
  • Firstpage
    448
  • Lastpage
    449
  • Abstract
    Liquid crystal polymer film provides an alternative to traditional polymer films for use as a substrate in microwave and millimeter wave flexible circuit construction. The liquid crystal polymer film has excellent mechanical properties and processability. However, due to the nature of the liquid crystal polymer molecules and the hot extrusion fabrication process, the liquid crystal polymer film will have strong molecular anisotropy. Therefore the dielectric properties will also have strong anisotropy. To precisely characterize the dielectric anisotropy accurately in microwave frequency range, a special slotted cavity for film materials is designed and fabricated. The derivation of the electromagnetic quantities for the new slotted cavity method resulted in accurate determination of dielectric permittivity and loss tangent of liquid crystal polymer films in anisotropic orientations.
  • Keywords
    dielectric losses; dielectric thin films; extrusion; flexible electronics; liquid crystal polymers; microwave circuits; millimetre wave circuits; permittivity; polymer films; dielectric loss tangent; dielectric permittivity; electromagnetic quantity; hot extrusion fabrication processing; liquid crystal polymer film; liquid crystal polymer molecule; microwave flexible circuit construction; millimeter wave flexible circuit construction; molecular anisotropy; precise dielectric anisotropy characterization; transverse slotted cavity method; Cavity resonators; Dielectric measurement; Dielectrics; Films; Liquid crystal polymers; Transmission line measurements; Dielectric characterization; cavity; liquid crystal polymer; microwave measurement; substrate material; uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on
  • Conference_Location
    Rio de Janeiro
  • ISSN
    0589-1485
  • Print_ISBN
    978-1-4799-5205-2
  • Type

    conf

  • DOI
    10.1109/CPEM.2014.6898452
  • Filename
    6898452