DocumentCode
236376
Title
Precise dielectric characterization of liquid crystal polymer films at microwave frequencies by new transverse slotted cavity
Author
Liu Chao ; Afsar, Mohammed N.
Author_Institution
Dept. of Electr. & Comput. Eng., Tufts Univ., Medford, MA, USA
fYear
2014
fDate
24-29 Aug. 2014
Firstpage
448
Lastpage
449
Abstract
Liquid crystal polymer film provides an alternative to traditional polymer films for use as a substrate in microwave and millimeter wave flexible circuit construction. The liquid crystal polymer film has excellent mechanical properties and processability. However, due to the nature of the liquid crystal polymer molecules and the hot extrusion fabrication process, the liquid crystal polymer film will have strong molecular anisotropy. Therefore the dielectric properties will also have strong anisotropy. To precisely characterize the dielectric anisotropy accurately in microwave frequency range, a special slotted cavity for film materials is designed and fabricated. The derivation of the electromagnetic quantities for the new slotted cavity method resulted in accurate determination of dielectric permittivity and loss tangent of liquid crystal polymer films in anisotropic orientations.
Keywords
dielectric losses; dielectric thin films; extrusion; flexible electronics; liquid crystal polymers; microwave circuits; millimetre wave circuits; permittivity; polymer films; dielectric loss tangent; dielectric permittivity; electromagnetic quantity; hot extrusion fabrication processing; liquid crystal polymer film; liquid crystal polymer molecule; microwave flexible circuit construction; millimeter wave flexible circuit construction; molecular anisotropy; precise dielectric anisotropy characterization; transverse slotted cavity method; Cavity resonators; Dielectric measurement; Dielectrics; Films; Liquid crystal polymers; Transmission line measurements; Dielectric characterization; cavity; liquid crystal polymer; microwave measurement; substrate material; uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on
Conference_Location
Rio de Janeiro
ISSN
0589-1485
Print_ISBN
978-1-4799-5205-2
Type
conf
DOI
10.1109/CPEM.2014.6898452
Filename
6898452
Link To Document