Title :
Programmable capacitors developed at NIST
Author :
Koffman, A.D. ; Lee, R.D. ; Lee, Lun-Hui ; Shields, S.H. ; Liu, Zhe ; Wang, Yannan
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Abstract :
NIST has produced several digitally programmable capacitance standards based on a modification of a fixed commercial fused-silica capacitance standard. The commercial device consists of 23 capacitors of roughly binary values that have been configured to combine via computer control to produce any capacitance value in the range from about 0.1 fF to 110 pF, with sub-femtofarad resolution. Upon placing the device in a custom enclosure inside an air bath, the shortterm capacitance stability achieved using a commercial capacitance bridge is approximately 5.0×108 pF over the full capacitance range.
Keywords :
bridge circuits; capacitance measurement; capacitors; measurement standards; NIST; air bath; capacitance 0.1 pF to 110 pF; capacitance bridge; commercial fused-silica capacitance standard; computer control; digitally programmable capacitance standard; programmable capacitor; short-term capacitance stability; subfemtofarad resolution; Capacitance; Capacitors; Circuit stability; NIST; Stability criteria; Thermal stability; Air bath; calculable capacitor; programmable capacitor; standard capacitor; temperature control;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on
Conference_Location :
Rio de Janeiro
Print_ISBN :
978-1-4799-5205-2
DOI :
10.1109/CPEM.2014.6898467