Title :
Design and calibration of a compact quasi-optical system for material characterization in millimeter/sub-millimeter wave domain
Author :
Kazemipour, Alireza ; See-Khee Yee ; Hudlicka, Martin ; Salhi, Mohammed ; Kleine-Ostmann, Thomas ; Schrader, Thorsten
Author_Institution :
Phys.-Tech. Bundesanstalt, Braunschweig, Germany
Abstract :
A compact spectrometer setup based on conventional rectangular horn antennas and two symmetrical parabolic mirrors is designed to provide a plane wave on the material-under-test. A commercial Vector Network Analyzer (VNA) and waveguide frequency extension units are used to measure the scattering parameters. A simple practical calibration process is used to determine the S-parameters on the material surface without need of high-cost micrometer positioners. Several materials are measured and the complex permittivity is presented.
Keywords :
S-parameters; calibration; horn antennas; materials testing; millimetre wave measurement; mirrors; network analysers; optical materials; optical variables measurement; permittivity measurement; submillimetre wave measurement; S-parameter measurement; VNA; calibration; compact quasioptical system; compact spectrometer setup; complex permittivity; material characterization; material measurement; material-under-test; micrometer positioner; millimeter-submillimeter wave domain; rectangular horn antenna; scattering parameter measurement; symmetrical parabolic mirror; vector network analyzer; waveguide frequency extension unit; Calibration; Loss measurement; Materials; Mirrors; Permittivity; Permittivity measurement; Scattering parameters; Free-space calibration; Material Characterization; Millimeter and sub-millimeter waves; Quasi-optical setup;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on
Conference_Location :
Rio de Janeiro
Print_ISBN :
978-1-4799-5205-2
DOI :
10.1109/CPEM.2014.6898469
