DocumentCode
2364128
Title
Electronically scanned arrays for fast testing of large antennas
Author
Durand, L. ; Duchesne, L. ; Foged, L.J.
Author_Institution
SATIMO Courtaboeuf, France
fYear
2010
fDate
1-3 March 2010
Firstpage
1
Lastpage
4
Abstract
The use of probe array is a well established technology for spherical near field systems offering all the possibilities and accuracies of traditional single probe testing at a much faster speed. Frequency ranges for probe arrays are from 75 MHz to 18 GHz and probes up to 40 GHz are currently under development. Recently the problem of exhaustive testing of the high number of multi beam antennas embarked on future satellite systems has received considerable attention. Based on conventional measurements techniques this testing would lead to unacceptable cost and duration. Solutions based on "hybrid systems" taking full advantage of fast probe array technology on large mechanical scanners can drastically reduce the measurement time compared to conventional single probe test systems.
Keywords
UHF antennas; antenna arrays; antenna testing; microwave antennas; millimetre wave antennas; electronically scanned arrays; hybrid systems; large antenna testing; probe array; satellite systems; spherical near field systems; Antenna arrays; Antenna measurements; Costs; Directional antennas; Electronic equipment testing; Frequency; Measurement techniques; Probes; Satellites; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Antenna Technology (iWAT), 2010 International Workshop on
Conference_Location
Lisbon
Print_ISBN
978-1-4244-4883-8
Electronic_ISBN
978-1-4244-4885-2
Type
conf
DOI
10.1109/IWAT.2010.5464795
Filename
5464795
Link To Document