DocumentCode :
2364128
Title :
Electronically scanned arrays for fast testing of large antennas
Author :
Durand, L. ; Duchesne, L. ; Foged, L.J.
Author_Institution :
SATIMO Courtaboeuf, France
fYear :
2010
fDate :
1-3 March 2010
Firstpage :
1
Lastpage :
4
Abstract :
The use of probe array is a well established technology for spherical near field systems offering all the possibilities and accuracies of traditional single probe testing at a much faster speed. Frequency ranges for probe arrays are from 75 MHz to 18 GHz and probes up to 40 GHz are currently under development. Recently the problem of exhaustive testing of the high number of multi beam antennas embarked on future satellite systems has received considerable attention. Based on conventional measurements techniques this testing would lead to unacceptable cost and duration. Solutions based on "hybrid systems" taking full advantage of fast probe array technology on large mechanical scanners can drastically reduce the measurement time compared to conventional single probe test systems.
Keywords :
UHF antennas; antenna arrays; antenna testing; microwave antennas; millimetre wave antennas; electronically scanned arrays; hybrid systems; large antenna testing; probe array; satellite systems; spherical near field systems; Antenna arrays; Antenna measurements; Costs; Directional antennas; Electronic equipment testing; Frequency; Measurement techniques; Probes; Satellites; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antenna Technology (iWAT), 2010 International Workshop on
Conference_Location :
Lisbon
Print_ISBN :
978-1-4244-4883-8
Electronic_ISBN :
978-1-4244-4885-2
Type :
conf
DOI :
10.1109/IWAT.2010.5464795
Filename :
5464795
Link To Document :
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