• DocumentCode
    2364136
  • Title

    Technological realization of low on-resistance FLYMOS/spl trade/ transistors dedicated to automotive applications

  • Author

    Alves, S. ; Morancho, F. ; Reynès, J-M ; Margheritta, J. ; Deram, I. ; Isoird, K. ; Tranduc, H.

  • Author_Institution
    Freescale Semicond. France SAS, Toulouse
  • fYear
    2005
  • fDate
    11-14 Sept. 2005
  • Abstract
    The present 14 Volts automotive electrical system will soon become 42 Volts. For these future automotive applications, development of 80 Volts power MOSFETs exhibiting low on-resistance is desired. The "floating island" MOSFET (FLIMOSFET) is one of the new candidates to break the silicon limit, which is the "specific on-resistance / breakdown voltage" trade-off limit of conventional power MOSFETs. In this paper, the "floating island" concept has been implemented on silicon: new vertical N-channel FLIMOSFETs (FLYMOStrade) dedicated to automotive applications (below 100 Volts) have been fabricated for the first time, using two steps epitaxy process. Experimental results show that FLYMOStrade transistors exhibit lower breakdown voltages than what was expected by simulations (maximum of 73 Volts) but also improved specific on-resistances compared to the conventional VDMOSFET (33% improvement of the specific on-resistance for the same breakdown voltage). In other words, in terms of "specific on-resistance / breakdown voltage" trade-off, the FLYMOStrade is one of the best MOS devices in low voltage applications. These measurements validate the "floating island" concept and the efficiency of the original edge cell that is used in the FLYMOStrade technology
  • Keywords
    automotive electronics; electric breakdown; power MOSFET; 14 V; 42 V; 80 V; FLIMOSFET; FLYMOS transistors; MOS devices; automotive applications; automotive electrical system; breakdown voltage; floating island MOSFET; power MOSFET; specific on-resistance; two steps epitaxy process; Automotive applications; Automotive engineering; Batteries; Breakdown voltage; Epitaxial growth; MOSFET circuits; Power MOSFET; Silicon; Synthetic aperture sonar; Uniform resource locators; MOSFET; Power semiconductor device; automotive application;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics and Applications, 2005 European Conference on
  • Conference_Location
    Dresden
  • Print_ISBN
    90-75815-09-3
  • Type

    conf

  • DOI
    10.1109/EPE.2005.219700
  • Filename
    1665890