Title :
Sobolev duals of random frames
Author :
Güntürk, C. Sinan ; Lammers, Mark ; Powell, Alex ; Saab, Rayan ; Yilmaz, Özgur
Author_Institution :
Courant Inst. of Math. Sci., New York Univ., New York, NY, USA
Abstract :
Sobolev dual frames have recently been proposed as optimal alternative reconstruction operators that are specifically tailored for Sigma-Delta (¿¿) quantization of frame coefficients. While the canonical dual frame of a given analysis (sampling) frame is optimal for the white-noise type quantization error of Pulse Code Modulation (PCM), the Sobolev dual offers significant reduction of the reconstruction error for the colored-noise of ¿¿ quantization. However, initial quantitative results concerning the use of Sobolev dual frames required certain regularity assumptions on the given analysis frame in order to deduce improvements of performance on reconstruction that are similar to those achieved in the standard setting of bandlimited functions. In this paper, we show that these regularity assumptions can be lifted for (Gaussian) random frames with high probability on the choice of the analysis frame. Our results are immediately applicable in the traditional oversampled (coarse) quantization scenario, but also extend to compressive sampling of sparse signals.
Keywords :
Gaussian distribution; pulse code modulation; quantisation (signal); sigma-delta modulation; signal sampling; Gaussian random frames; Sobolev dual frames; canonical dual frame; compressive sampling; frame coefficients; optimal alternative reconstruction operators; pulse code modulation; reconstruction error; sampling frame; sigma-delta quantization; sparse signals; standard setting; white-noise type quantization error; Colored noise; Delta-sigma modulation; Low pass filters; Modulation coding; Noise shaping; Performance analysis; Phase change materials; Pulse modulation; Quantization; Sampling methods;
Conference_Titel :
Information Sciences and Systems (CISS), 2010 44th Annual Conference on
Conference_Location :
Princeton, NJ
Print_ISBN :
978-1-4244-7416-5
Electronic_ISBN :
978-1-4244-7417-2
DOI :
10.1109/CISS.2010.5464811