Title :
1-D BJT parameter extraction for Cuasi-3D simulation of four-layer devices
Author :
Quintero, Rodolfo
Author_Institution :
Dept. of Electr. Eng., CINVESTAV-IPN, Mexico, Mexico
Abstract :
Cuasi-3D simulation methods allow extending 2D numerical simulations to the 3rd dimension, in ways that trade detail of information for computational efficiency. The Cuasi-3D simulation method of 4-layer power devices reported previously by the author requires Gummel-Poon BJT parameters, that should ideally be derived from 1D charge transport simulations. The desired one-dimensionality can only be approximated with standard 2D simulators such as Atlas, due mainly to current crowding. We report a novel one-dimensional parameter extraction method based on the charge transport equations, and implemented with the SGFW general purpose simulator. Unlike 2D simulations, where saturation currents are difficult to obtain because of the high mesh densities required at the junctions, very high 1D mesh densities can be simulated in less than 15 minutes in a Pentium IV computer. This parameter extraction method is faster and more precise than those based on 2D simulations.
Keywords :
bipolar transistors; circuit simulation; parameter estimation; semiconductor device models; 1D BJT parameter extraction; 2D simulator; Atlas; Cuasi-3D simulation; Gummel-Poon BJT parameters; SGFW general purpose simulator; charge transport simulations; four-layer devices; mesh density; Anodes; Boundary conditions; Circuit simulation; Computational modeling; Current distribution; IEEE catalog; Impurities; Leakage current; Parameter extraction; Protection; Device; extraction; parameter; power; simulation; solid-state;
Conference_Titel :
Electrical and Electronics Engineering, 2005 2nd International Conference on
Print_ISBN :
0-7803-9230-2
DOI :
10.1109/ICEEE.2005.1529619