DocumentCode
2364566
Title
Multiwave mixing of terahertz detuned optical pulses in semiconductor optical amplifiers
Author
Tang, J.M. ; Shore, K.A.
Author_Institution
Sch. of Electron. Eng. & Comput. Syst., Univ. of Wales, Bangor, UK
fYear
1998
fDate
3-4 Sep 1998
Firstpage
183
Lastpage
186
Abstract
A new model describing multiwave mixing of terahertz detuned picosecond optical pulses in semiconductor optical amplifiers (SOAs) is presented, by taking into account carrier depletion, carrier heating, spectral hole-burning, two-photon absorption, ultrafast nonlinear refraction and small signal gain differences for different mixing pulses. Special attention is paid to the influence of probe depletion (PD) and cross-gain modulation (XGM) on four-wave mixing (FWM) of optical pulses in SOAs. The effects of PD and XGM become more significant for shorter input pulsewidth, higher pulse energy and smaller pump-probe frequency detuning. Results indicate that if the effects of PD and XGM are neglected the FWM efficiency can be seriously overestimated
Keywords
electro-optical modulation; high-speed optical techniques; laser theory; laser tuning; light absorption; multiwave mixing; optical hole burning; optical pumping; semiconductor device models; semiconductor optical amplifiers; two-photon processes; FWM efficiency; carrier depletion; carrier heating; cross-gain modulation; higher pulse energy; mixing pulses; multiwave mixing; probe depletion; semiconductor optical amplifiers; shorter input pulsewidth; small signal gain differences; smaller pump-probe frequency detuning; spectral hole-burning; terahertz detuned optical pulses; terahertz detuned picosecond optical pulses; two-photon absorption; ultrafast nonlinear refraction; Absorption; Four-wave mixing; Heating; Multiwave mixing; Optical pulses; Optical refraction; Probes; Pulse amplifiers; Pulse modulation; Semiconductor optical amplifiers;
fLanguage
English
Publisher
ieee
Conference_Titel
Terahertz Electronics Proceedings, 1998. THz Ninety Eight. 1998 IEEE Sixth International Conference on
Conference_Location
Leeds
Print_ISBN
0-7803-4903-2
Type
conf
DOI
10.1109/THZ.1998.731713
Filename
731713
Link To Document