Title :
CVD graphene for electrical quantum metrology
Author :
Thodkar, K. ; Nef, C. ; Fu, Wei ; Schonenberger, C. ; Calame, M. ; Luond, Felix ; Overney, Frederic ; Jeanneret, Blaise
Author_Institution :
Phys. Dept., Univ. of Basel, Basel, Switzerland
Abstract :
Graphene, a single atom thick material with carbon atoms arranged in a hexagonal lattice is widely being touted as the new wonder material for its interesting electrical and mechanical properties [1]. In particular, the observation of the Quantum Hall effect (QHE) in graphene has opened the way for a new quantum standard of resistance. Our research focuses on QHE and Raman characterization of chemical vapor deposited (CVD) graphene. In this paper we describe the CVD growth of graphene films, their transfer to substrates and their characterization using Raman spectroscopy and electrical transport measurements.
Keywords :
Raman spectra; chemical vapour deposition; electric variables measurement; graphene; quantum Hall effect; C; CVD graphene; Raman spectroscopy; chemical vapor deposition; electrical quantum metrology; electrical transport measurements; quantum Hall effect; Electrical resistance measurement; Films; Graphene; Magnetic field measurement; Resistance; Substrates; Temperature measurement; Chemical Vapor Deposition (CVD); Copper (Cu); Graphene (G); Quantum Hall effect (QHE);
Conference_Titel :
Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on
Conference_Location :
Rio de Janeiro
Print_ISBN :
978-1-4799-5205-2
DOI :
10.1109/CPEM.2014.6898498