• DocumentCode
    236474
  • Title

    Transportation effect of Ni-Cr based metal-foil standard resistors in a trilateral comparison pilot study between KRISS, NIST, and NMIJ

  • Author

    Kaneko, Nobu-hisa ; Oe, Takehiko ; Wan-Seop Kim ; Dong-Hun Chae ; Elmquist, Randolph ; Kraft, Michael

  • Author_Institution
    Nat. Metrol. Inst. of Japan, Nat. Inst. of Adv. Ind. Sci. & Technol, Tsukuba, Japan
  • fYear
    2014
  • fDate
    24-29 Aug. 2014
  • Firstpage
    546
  • Lastpage
    547
  • Abstract
    This paper describes a study on the transportation effect using four 100 Ω standard resistors of a new construction. All resistors have been transported by air: two of the resistors in hand-carried luggage and the other two by normal air freight. The standards have been measured by three national metrology institutes, the Korean Research Institute of Standards, the National Institute of Standards and Technology in USA and the National Metrology Institute of Japan by means of their primary national standards based on the quantum Hall effect. No noticeable difference between the two transportation methods has been detected within a standard uncertainty of 0.01 μΩ/Ω and performance suitable for international comparisons of this type of resistors has been demonstrated.
  • Keywords
    chromium; freight handling; measurement standards; measurement uncertainty; metallic thin films; nickel; quantum Hall effect; resistors; KRISS; Korean Research Institute of Standards; NIST; NMIJ; National Institute of Standards and Technology; National Metrology Institute of Japan; Ni-Cr; USA; hand carried luggage; metal foil standard resistor; normal air freight; primary national standards; quantum Hall effect; standard uncertainty; transportation effect; Electrical resistance measurement; NIST; Resistance; Resistors; Temperature measurement; Transportation; international comparison; quantum Hall effect; resistance standard; standard resistor; transportation effect;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on
  • Conference_Location
    Rio de Janeiro
  • ISSN
    0589-1485
  • Print_ISBN
    978-1-4799-5205-2
  • Type

    conf

  • DOI
    10.1109/CPEM.2014.6898501
  • Filename
    6898501