• DocumentCode
    2364759
  • Title

    Bipolar 6.5 kV-SiC-diodes: on the road to industrial application

  • Author

    Bartsch, Wolfgang ; Elpelt, Rudolf ; Schoerner, Reinhold ; Dohnke, Karl-Otto ; Bloecher, Bernd ; Koerber, Klaus

  • Author_Institution
    SiCED Electron. Dev. GmbH & Co. KG, Erlangen
  • fYear
    2005
  • fDate
    11-14 Sept. 2005
  • Abstract
    This work presents the transient behaviour of paralleled 6.5 kV bipolar SiC diodes with aluminium implanted emitters. The switching behaviour at a current level of 30 A is shown at DC link voltages up to 4 kV and at a junction temperature of 125degC. Different IGBT gate resistor conditions realise different rates of current decay up to 1000 A/mus. Experimental results are discussed in terms of snappiness
  • Keywords
    insulated gate bipolar transistors; semiconductor diodes; wide band gap semiconductors; 125 degC; 30 A; 6.5 kV; DC link voltages; IGBT gate resistor; aluminium implanted emitters; bipolar SiC diodes; junction temperature; switching behaviour; Annealing; Doping; Electronic circuits; Fabrication; Resistors; Semiconductor device measurement; Semiconductor diodes; Silicon carbide; Temperature; Voltage; Bipolar device; High power discrete device; Measurement; Passive component; Power semiconductor device;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics and Applications, 2005 European Conference on
  • Conference_Location
    Dresden
  • Print_ISBN
    90-75815-09-3
  • Type

    conf

  • DOI
    10.1109/EPE.2005.219731
  • Filename
    1665921