DocumentCode
2365001
Title
Effect of protection diodes on the behavior of CMOS gates in the presence of supply dips
Author
Amer, Hassanein H.
Author_Institution
Sci. Dept., American Univ., Cairo, Egypt
Volume
2
fYear
1997
fDate
25-28 May 1997
Firstpage
536
Abstract
This paper shows that, in some CMOS logic gates, the protection diodes may decrease the probability of occurrence of transient failures due to power supply dips. Furthermore, it is observed that protection diodes make output voltage sensitive to some input vectors more than others
Keywords
CMOS logic circuits; failure analysis; logic gates; power semiconductor diodes; power supply quality; protection; transient analysis; CMOS logic gate; power supply dip; protection diode; transient failure; CMOS logic circuits; Circuit simulation; Diodes; Electronics packaging; Electrostatic discharge; Power supplies; Protection; SPICE; Transmitters; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical and Computer Engineering, 1997. Engineering Innovation: Voyage of Discovery. IEEE 1997 Canadian Conference on
Conference_Location
St. Johns, Nfld.
ISSN
0840-7789
Print_ISBN
0-7803-3716-6
Type
conf
DOI
10.1109/CCECE.1997.608278
Filename
608278
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