A Model and Verification for Temperature Dependency of the Noise in Large Size CCD Image Sensor

Author

Hoshino, Kazuhiro ; Nishimura, Toshihiro

Author_Institution

Imaging Syst. Dev. Sect., Sony Corp., Tokyo

fYear

2006

fDate

6-10 Nov. 2006

Firstpage

3290

Lastpage

3293

Abstract

This paper describes the temperature dependence of the noise of a large size CCD image sensor used in a digital single-lens reflex camera. To clarify the temperature dependence of the noise, the CCD was cooled directly with a Peltier device. The change in noise after black correction of the actual experiment result was consistent with the Shockley-Read-Hall (SRH) model, confirming the validity of this model. Moreover, because the residual noise after black correction increased with temperature, the main factor is considered to be random noise. A comparison result of the two dimensional noise simulations as imaging picture and the actual image in the noise based on the SRH model. 2-D image simulations based on the SRH model agreed well with the experiment data, again confirming the model validity

Keywords

CCD image sensors; photographic lenses; random noise; 2D image simulations; CCD image sensor; Shockley-Read-Hall model; digital single-lens reflex camera; noise temperature dependency; random noise; Cameras; Charge coupled devices; Charge-coupled image sensors; Heat sinks; Noise cancellation; Noise level; Pixel; Temperature dependence; Temperature sensors; Thermoelectric devices;

fLanguage

English

Publisher

ieee

Conference_Titel

IEEE Industrial Electronics, IECON 2006 - 32nd Annual Conference on

Conference_Location

Paris

ISSN

1553-572X

Print_ISBN

1-4244-0390-1

Type

conf

DOI

10.1109/IECON.2006.347629

Filename

4153055