DocumentCode
236501
Title
A novel experimental validation method of dynamic X-parameters includes long-term memory effects
Author
Yuanxiao Gou ; Jiahui Fu ; Maoliu Lin
Author_Institution
Dept. of Microwave Eng., Harbin Inst. of Technol., Harbin, China
fYear
2014
fDate
24-29 Aug. 2014
Firstpage
572
Lastpage
573
Abstract
A novel experimental validation method for the modeling of amplifier with long-term memory effects of dynamic X-parameters is proposed in this paper. The basic idea of this method is by applying the narrow step signal as stimulus signal to replace the classical two-tone measurements. The comparison results between the measured and the measurement-based model have a perfect agreement, and it proves the validity of theory.
Keywords
amplifiers; microwave measurement; amplifier modeling; dynamic X-parameters; measurement-based model; memory effect; stimulus signal; Equations; Kernel; Mathematical model; Microwave amplifiers; Microwave communication; Microwave measurement; Behavioral model; Dynamic X-parameters; long-term memory effects; narrow step signal;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on
Conference_Location
Rio de Janeiro
ISSN
0589-1485
Print_ISBN
978-1-4799-5205-2
Type
conf
DOI
10.1109/CPEM.2014.6898514
Filename
6898514
Link To Document