A reliable simple method to extract the intrinsic material properties in millimeter/sub-millimeter wave domain

A simple method is presented to extract the material characteristics from the scattering parameters in the frequency domain. The method is based on “transmission” measurement data only and can give the complex permittivity and/or the absorption and refraction index via easy arithmetic operations with closed-form formulas. Therefore, a parametric error analysis will be feasible for metrological aspects to show important uncertainty contributions. The actual measurements have been performed with a compact quasi-optical free-space setup in the frequency band from 50 GHz to 500 GHz and the detailed results are presented to show the performance of the method.