• DocumentCode
    2365119
  • Title

    Two dimensional analytical subthreshold swing model of a double gate MOSFET with Gate-S/D underlap, asymmetric and independent gate features

  • Author

    Vaddi, Ramesh ; Dasgupta, S. ; Agarwal, R.P.

  • Author_Institution
    ECE Dept., Indian Inst. of Technol., Roorkee, India
  • fYear
    2011
  • fDate
    25-27 April 2011
  • Firstpage
    67
  • Lastpage
    72
  • Abstract
    A novel analytical model for subthreshold slope of a generic double-gate MOSFET (DGMOSFET) with gate-to-source/drain underlap is proposed. The accuracy of the new model is verified based on comparisons with previously published models, experimental data and numerical simulation results. With the reduction in body thickness, an improvement in underlap independent gate (4T) DGMOSFET subthreshold slope value is observed, particularly as back gate oxide asymmetry would increase in comparison to that of front gate oxide thickness. Models demonstrate that asymmetric work function underlap 4T DGMOSFETs would have better device subthreshold slope value along with increased back gate oxide asymmetry.
  • Keywords
    MOSFET; numerical analysis; DGMOSFET subthreshold slope; asymmetric gate features; asymmetric work function underlap 4T; back gate oxide asymmetry; front gate oxide thickness; gate-to-source-drain underlap; generic double-gate MOSFET; independent gate features; numerical simulation; two dimensional analytical subthreshold swing model; Analytical models; Data models; Logic gates; MOSFET circuits; Mathematical model; Numerical models; Silicon; Asymmetric double gate MOSFET; Independent gate (4T) DGMOSFET; Tied gate (3T) DGMOSFET; back gate effects; gate underlap engineering; subthreshold swing model;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Devices, Systems and Applications (ICEDSA), 2011 International Conference on
  • Conference_Location
    Kuala Lumpur
  • ISSN
    2159-2047
  • Print_ISBN
    978-1-61284-388-9
  • Type

    conf

  • DOI
    10.1109/ICEDSA.2011.5959057
  • Filename
    5959057