DocumentCode :
2365171
Title :
SiC bipolar devices for high power and integrated drivers
Author :
Ostling, Mikael ; Ghandi, Reza ; Buono, B. ; Lanni, Luigia ; Malm, B. Gunnar ; Zetterling, Carl-Mikael
Author_Institution :
Sch. of ICT, KTH R. Inst. of Technol., Kista, Sweden
fYear :
2011
fDate :
9-11 Oct. 2011
Firstpage :
227
Lastpage :
234
Abstract :
Silicon carbide (SiC) semiconductor devices for high power applications are now commercially available as discrete devices. The first SiC device to reach the market was the unipolar Schottky diode. Active switching devices such as bipolar junction transistors (BJTs), field effect transistors (JFETs and MOSFETs) are now being offered in the voltage range up to 1.2 kV. SiC material quality and epitaxy processes have greatly improved and degradation free 100 mm wafers are readily available, which has removed one obstacle for the introduction of bipolar devices. The SiC wafer roadmap looks very favorable as volume production takes off. Other advantages of SiC are the possibility of high temperature operation (> 300 °C) and in radiation hard environments, which could offer considerable system advantages. Thanks to the mature SiC process technology, low-power integrated circuits are now also viable. Such circuits could find use in integrated drivers operating at elevated temperatures.
Keywords :
bipolar integrated circuits; driver circuits; power integrated circuits; power semiconductor devices; silicon compounds; wide band gap semiconductors; SiC; active switching device; bipolar device; epitaxy process; high power application; high power driver; integrated driver; material quality; silicon carbide semiconductor device; unipolar Schottky diode; Insulated gate bipolar transistors; PIN photodiodes; Rectifiers; Schottky diodes; Silicon; Silicon carbide; Temperature; Silicon Carbide bipolar process technology; analog/digital circuits; bipolar physics and simulation; high temperature; integrated drivers; power devices; radiation hardness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 2011 IEEE
Conference_Location :
Atlanta, GA
ISSN :
1088-9299
Print_ISBN :
978-1-61284-165-6
Type :
conf
DOI :
10.1109/BCTM.2011.6082788
Filename :
6082788
Link To Document :
بازگشت