• DocumentCode
    2365190
  • Title

    Effective photoluminescence modification of ZnO nanocombs by plasma immersion ion implantation

  • Author

    Yang, Y. ; Tay, B.K. ; Sun, X.W. ; Han, Z.J. ; Shen, Z.X. ; Lincoln, C. ; Smith, T.

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore
  • fYear
    2008
  • fDate
    24-27 March 2008
  • Firstpage
    20
  • Lastpage
    24
  • Abstract
    Surface defects passivation of ZnO nanocombs was performed through a Ti plasma immersion ion implantation (PIII) with low bias voltages ranging from 0-10 kV. The room temperature near-band-edge emission was enhanced for modified ZnO nanostructures while the defect-related green band was completely quenched. Detailed temperature dependence PL revealed that the deep-level emissions were surface related and it was the most affected recombination processes by PHI, whereas the surface exciton related emission was slowly quenched as the ion energy increased. Time-resolved PL shows that the lifetime of the UV emission has been enhanced whereas the long lifetime of visible emission of the untreated ZnO nanocombs has been largely shortened. Our work demonstrates that metal ion PIII can be an effective way for surface modification/passivation of ZnO nanostructures to improve the optical properties.
  • Keywords
    II-VI semiconductors; deep levels; excitons; nanostructured materials; passivation; photoluminescence; plasma immersion ion implantation; radiation quenching; semiconductor doping; titanium; wide band gap semiconductors; zinc compounds; PIII; UV emission; ZnO:Ti; deep-level emissions; nanocombs; nanostructures; near-band-edge emission; photoluminescence; plasma immersion ion implantation; quenching; recombination; room temperature; surface defect passivation; surface exciton; temperature 293 K to 298 K; visible emission; voltage 0 kV to 10 kV; Excitons; Low voltage; Nanostructures; Particle beam optics; Passivation; Photoluminescence; Plasma immersion ion implantation; Plasma temperature; Temperature dependence; Zinc oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanoelectronics Conference, 2008. INEC 2008. 2nd IEEE International
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-1572-4
  • Electronic_ISBN
    978-1-4244-1573-1
  • Type

    conf

  • DOI
    10.1109/INEC.2008.4585429
  • Filename
    4585429