DocumentCode :
236531
Title :
Characterization of photodiodes in the visible spectral region
Author :
Alves, Luciana
Author_Institution :
Radiometry & Photometry Lab., Nat. Inst. of Metrol., Quality & Technol. (Inmetro), Rio de Janeiro, Brazil
fYear :
2014
fDate :
24-29 Aug. 2014
Firstpage :
602
Lastpage :
603
Abstract :
The establishment of the ultraviolet irradiance responsivity scale for the purpose of calibration of commercial UVA and UVB radiometers depends on well-characterized broadband UV radiometers as radiometric scale transfer standards. The UV enhanced silicon photodiodes used for the construction of such transfer standards have been characterized with respect to spectral responsivity and spatial uniformity in the visible spectral region. The shunt resistance of such photodiodes had also been measured.
Keywords :
calibration; electric resistance measurement; elemental semiconductors; photodetectors; photodiodes; radiometers; silicon; transfer standards; ultraviolet detectors; Si; UV detector; UV enhanced silicon photodiode; UVA radiometer; UVB radiometer; broadband UV radiometer; radiometric scale transfer standard; shunt resistance measurement; spectral responsivity; ultraviolet irradiance responsivity scale establishment; visible spectral region; Calibration; Detectors; Electrical resistance measurement; Optical filters; Photodiodes; Radiometers; Resistance; photodiode; responsivity; ultraviolet; uniformity; visible;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on
Conference_Location :
Rio de Janeiro
ISSN :
0589-1485
Print_ISBN :
978-1-4799-5205-2
Type :
conf
DOI :
10.1109/CPEM.2014.6898529
Filename :
6898529
Link To Document :
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