DocumentCode
2365392
Title
The Effect of Filling the Unspecified Values of a Test Set on the Test Set Quality
Author
Pomeranz, Irith ; Reddy, Sudhakar M.
Author_Institution
Sch. of Electr. & Comput. Eng., Purdue Univ. W. Lafayette, West Lafayette, IN
fYear
2009
fDate
5-9 Jan. 2009
Firstpage
215
Lastpage
220
Abstract
Test generation and test data compression processes create test vectors with unspecified input values that need to be filled. We study the extent to which filling the unspecified input values affects the untargeted fault coverage of a test set. To make the study independent of any particular test generation or test data compression scheme, we consider test sets for stuck-at faults that are obtained by first unspecifying as many values as possible without losing stuck-at fault coverage, and then filling the unspecified values randomly. The results indicate that there are significant differences in the untargeted fault coverage between different test sets. The differences in the average number of detections of stuck-at faults are less noticeable. We also show that adding a small fraction of untargeted faults to the set of faults considered during the unspecifying process improves significantly the untargeted fault coverage after filling of unspecified values.
Keywords
fault diagnosis; logic testing; stuck-at faults; test data compression; test generation; test set quality; test vectors; untargeted fault coverage; Broadcasting; Cities and towns; Fault detection; Filling; Logic testing; Power dissipation; Test data compression; Very large scale integration; bridging faults; stuck-at faults; test data compression; test generation;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design, 2009 22nd International Conference on
Conference_Location
New Delhi
ISSN
1063-9667
Print_ISBN
978-0-7695-3506-7
Type
conf
DOI
10.1109/VLSI.Design.2009.11
Filename
4749677
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