Title :
High performance 1300-nm dilute-nitride quantum well lasers by MOCVD
Author :
Tansu, Nelson ; Mawst, Luke J.
Author_Institution :
Dept. of Electr. Comput. Eng., Wisconsin Univ., Madison, WI, USA
Abstract :
InGaAsN QW active lasers have shown promise as the material of choice for the active region of 1300-nm GaAs-based VCSELs. One of the challenges of growing InGaAsN QW lasers by MOCVD is due to the difficulties in incorporating N into the InGaAs QW, while maintaining a high optical quality film. The low purity of the N-precursor used in MOCVD (U-Dimethylhydrazine) is suspected as a possible reason for the low optical quality of MOCVD-grown InGaAsN QWs. In our approach, U-Dimethylhydrazine and AsH3 are utilized in the growth of our InGaAsN QW.
Keywords :
III-V semiconductors; MOCVD; distributed Bragg reflector lasers; gallium arsenide; gallium compounds; indium compounds; laser transitions; optical fabrication; quantum well lasers; 1300 nm; 1300-nm dilute-nitride quantum well lasers; AsH3; GaAs-based VCSELs; InGaAsN; InGaAsN QW growth; InGaAsN QW lasers; MOCVD growth technique; N-precursor; U-Dimethylhydrazine; active region; high optical quality film; Buffer layers; Indium gallium arsenide; Laser theory; Length measurement; MOCVD; Optical buffering; Optical films; Quantum well lasers; Temperature sensors; Vertical cavity surface emitting lasers;
Conference_Titel :
Semiconductor Laser Conference, 2002. IEEE 18th International
Print_ISBN :
0-7803-7598-X
DOI :
10.1109/ISLC.2002.1041104