DocumentCode
2365443
Title
Scanning laser interferometric evaluation of individual elements and an entire micro-electro-mechanical ultrasonic array transducer
Author
Blackshire, James L. ; Sathish, Shamachary
Author_Institution
Center for Mater. Diagnostics, Dayton Univ., OH, USA
Volume
2
fYear
2001
fDate
2001
Firstpage
883
Abstract
A high resolution scanning laser interferometer was used to map the dynamic displacements of individual elements, as well as the entire array of a micro-electro-mechanical ultrasonic transducer. Peak displacement levels were measured as a function of frequency, DC bias voltage, and AC drive voltage. An analysis of the displacement field for individual transducers showed evidence of over-responsive, under-responsive and non-responsive elements. The experimental results were compared with theoretical calculations for a circular membrane model, and were in reasonably good agreement. The role and influence of sidewall supports on the membrane motions is also discussed
Keywords
displacement measurement; light interferometry; measurement by laser beam; microsensors; ultrasonic transducer arrays; AC drive voltage; DC bias voltage; MEMS ultrasonic transducer; circular membrane model; displacement field analysis; frequency; heterodyne interferometry system; high resolution scanning laser interferometer; membrane motions; microelectromechanical US array transducer; nonresponsive elements; over-responsive elements; peak displacement levels measurement; scanning laser interferometric evaluation; sidewall supports; under-responsive elements; Biomembranes; Displacement measurement; Electrostatics; Frequency; Interferometry; Micromechanical devices; Optical arrays; Ultrasonic transducer arrays; Ultrasonic transducers; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium, 2001 IEEE
Conference_Location
Atlanta, GA
Print_ISBN
0-7803-7177-1
Type
conf
DOI
10.1109/ULTSYM.2001.991861
Filename
991861
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