DocumentCode :
2365443
Title :
Scanning laser interferometric evaluation of individual elements and an entire micro-electro-mechanical ultrasonic array transducer
Author :
Blackshire, James L. ; Sathish, Shamachary
Author_Institution :
Center for Mater. Diagnostics, Dayton Univ., OH, USA
Volume :
2
fYear :
2001
fDate :
2001
Firstpage :
883
Abstract :
A high resolution scanning laser interferometer was used to map the dynamic displacements of individual elements, as well as the entire array of a micro-electro-mechanical ultrasonic transducer. Peak displacement levels were measured as a function of frequency, DC bias voltage, and AC drive voltage. An analysis of the displacement field for individual transducers showed evidence of over-responsive, under-responsive and non-responsive elements. The experimental results were compared with theoretical calculations for a circular membrane model, and were in reasonably good agreement. The role and influence of sidewall supports on the membrane motions is also discussed
Keywords :
displacement measurement; light interferometry; measurement by laser beam; microsensors; ultrasonic transducer arrays; AC drive voltage; DC bias voltage; MEMS ultrasonic transducer; circular membrane model; displacement field analysis; frequency; heterodyne interferometry system; high resolution scanning laser interferometer; membrane motions; microelectromechanical US array transducer; nonresponsive elements; over-responsive elements; peak displacement levels measurement; scanning laser interferometric evaluation; sidewall supports; under-responsive elements; Biomembranes; Displacement measurement; Electrostatics; Frequency; Interferometry; Micromechanical devices; Optical arrays; Ultrasonic transducer arrays; Ultrasonic transducers; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 2001 IEEE
Conference_Location :
Atlanta, GA
Print_ISBN :
0-7803-7177-1
Type :
conf
DOI :
10.1109/ULTSYM.2001.991861
Filename :
991861
Link To Document :
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