DocumentCode :
236545
Title :
The establishment of high current DC shunt calibration system at KRISS and comparison with NRC
Author :
Kyu-Tae Kim ; Jae Kap Jung ; YoungSup Lee ; So, Eddy
Author_Institution :
Korea Res. Inst. of Stand. & Sci. (KRISS), Daejeon, South Korea
fYear :
2014
fDate :
24-29 Aug. 2014
Firstpage :
614
Lastpage :
615
Abstract :
The application of a simple binary step up method for possible calibration of high current DC shunts up to a few thousand amperes in which a pair of HCDC shunts are used to evaluate the current dependence of the shunt resistance. It was found that a complex exponential linear model can be applied to separate the drifts in voltage measurements from the contribution of the current coefficient of the shunt. This approach allows one to extract the information on the current coefficient of the shunt and together with low current measurement of the shunt resistance to calibrate the current output of HCDC source, which in turn can be used as a reference for calibration of customer´s shunts. In order to validate the step up method, the calibrated HCDC source was used to obtain DC current ratios which is to be compared with NRC´s high current ratio measurements of a multi-ratio 3000 A reference DC CT.
Keywords :
calibration; electric current measurement; electric resistance; voltage measurement; DC CT; DC current ratio; DC shunt calibration system; HCDC shunt; KRISS; NRC; binary step up method; complex exponential linear model; current coefficient; current measurement; drift separation; shunt resistance; voltage measurement; Calibration; Current measurement; Electrical resistance measurement; Resistance; Resistors; Voltage measurement; Voltmeters; DC CT; High current DC; calibration; comparison; current coefficient; current ratio; drift of voltage; voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on
Conference_Location :
Rio de Janeiro
ISSN :
0589-1485
Print_ISBN :
978-1-4799-5205-2
Type :
conf
DOI :
10.1109/CPEM.2014.6898535
Filename :
6898535
Link To Document :
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